Recent Publications

1. Towards nanoscale EXELFS analysis: limitation due to radiation damage
   D. Haskel, M. Sarikaya, M. Qian and E. A. Stern
   Micron 30, 185-194 (1999)
   
   
2. EXELFS as a tool for quantifying phase distributions in materials (Postscript, 248K)
   D. Haskel, M. Sarikaya, M. Qian and E. A. Stern
   Ultramicroscopy, v.58 n.3-4 p.353 (1995)
   
   
3. Radiation Damage and Spatial Resolution in the EXELFS of Inorganic Materials (Postscript, 55K)
   
4. Table.1
   D. Haskel, M. Sarikaya, M. Qian and E. A. Stern
   Microscopy and Microanalysis '96, 558 (1996)
   
   
5. Development of the EXELFS technique for nano-scale atomic structure determination (Postscript, 160K)
   D. Haskel, M. Qian, E. A. Stern and M. Sarikaya
   J. Phys IV FRANCE 7, C2-557 (1997)
   
   

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