Workshop Descriptions
Microbeams: Techniques and Applications:
X-ray microscopy is emerging as one of the most useful and exciting research tools at third-generation synchrotron sources. This workshop will cover the range of microbeam techniques, including spectromicroscopy, microdiffraction, phase-contrast imaging, and ultra-small angle scattering.
Structural and Functional Biology:
This workshop will highlight advances and opportunities in structural biology and biophysics at third-generation synchrotron sources. Techniques represented will include macromolecular crystallography, fiber diffraction, solution scattering, x-ray absorption spectroscopy, and various imaging methods.
Microscale and Molecular Environmental Science:
New opportunities in environmental science at molecular and micrometer length scales are opening up at the APS. Results of experiments conducted at the APS will be presented based on a variety of techniques such as x-ray absorption fine structure spectroscopy, x-ray fluorescence, x-ray scattering, and tomography.
Industrial R&D with Synchrotron Radiation:
The results of a diverse array of User experiments will be presented to demonstrate the usefulness of methods such as diffraction, x-ray absorption spectroscopy, small-angle scattering, x-ray magnetic circular dichroism, and imaging. A summary of recent advances in synchrotron research by industry at the APS will be provided.
Introduction to the APS:
This workshop for nonspecialists in synchrotron radiation will describe how researchers can make use of the unique capabilities of the APS in their work. The basic properties of third-generation synchrotron-radiation sources and approaches and techniques covering a broad range of scientific disciplines will be discussed. Lectures are intended to provide background information for the other workshops at the meeting.
Optics Metrology and Fabrication Workshop for APS Users:
Capabilities of the OFM Group in light of User science at the APS will be highlighted. Results of collaborations with Users will be presented in the areas of metrology, crystal fabrication and topography, thin-film deposition, and cooled-mirror design.