Abstracts

Measurement of Chemical Reaction Rates on Surfaces via X-ray Fluorescent Fluctuation

Morrel H. Cohen
Exxon Research and Engineering Co., Annandale, NJ 08801

Measurement of Chemical Reaction Rates on Surfaces via X-ray Fluorescent Fluctuation

Morrel H. Cohen
Exxon Research and Engineering Co., Annandale, NJ 08801

Optical Diagnostics of Surface Kinetics During Deposition Processes

N. Dietz and D. Aspnes
Departments of Physics and Materials Science, North Carolina State University, Raleigh NC 27695-7919

Basic Studies in Vibrational Excitation of Polymer Surface Photochemistry and Rapid Thermal Processing

Michael J. Kelley
Chemistry Department, University of Virginia, Charlottesville, Virginia 22906

Brooks H. Pate
Central Research, E.I. Du Pont de Nemours & Company, Wilmington, DE 19880

Performance Limitations on Short Wavelength FELs

S. Krinsky
NSLS,Brookhaven National Laboratory,Upton,NY 11973

Biomedical Applications of Ultraviolet Free-Electron Lasers

John C. Sutherland
Biology Department, Brookhaven National Laboratory, Upton, NY 11973

Material Activation Processes Leading to Surface Modification

David P. Taylor
Mechanics and Materials Technology Center, The Aerospace Corporation, 2350 E. El Segundo Blvd
M5/753, El Segundo, CA 90245, David.P.Taylor@notes.Aero.org

Approaches to Higher Brightness Beams in RF Photocathode Guns: The Longitudinal Dynamics Problem and the Short Bunch Blow-Out Approach

Gil Travish
INFN-LASA, Milano, Italy